发明名称 |
METHODS FOR GROWING III-V MATERIALS ON A NON III-V MATERIAL SUBSTRATE |
摘要 |
The present invention relates to a method for manufacturing semiconductor materials comprising epitaxial growing of group III-V materials, for example gallium arsenide (GaAs), on for example a non III-V group material like silicon (Si) substrates (wafers), and especially to pre-processing steps providing a location stabilisation of dislocation faults in a surface layer of the non III-V material wafer in an orientation relative to an epitaxial material growing direction during growing of the III-V materials, wherein the location stabilised dislocation fault orientations provides a barrier against threading dislocations (stacking of faults) from being formed in the growing direction of the III-V materials during the epitaxial growth process. |
申请公布号 |
US2014291810(A1) |
申请公布日期 |
2014.10.02 |
申请号 |
US201214239967 |
申请日期 |
2012.08.22 |
申请人 |
Bugge Renato;Myrvagnes Geir;Nilsen Tron Arne |
发明人 |
Bugge Renato;Myrvagnes Geir;Nilsen Tron Arne |
分类号 |
H01L21/02;C30B23/02;C30B23/06;H01L29/205 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method for epitaxial growing of at least one III-V group material on top of a substrate or wafer of a non III-V group material, wherein the method comprises a step of providing a pre-processing of a clean wafer with a respective first deposited nucleation layer and a respective second deposited bulk material layer, wherein
the material composition formed in the pre-processing step is further treated to form an interfacial misfit layer by exposing the material composition from the pre-processing step to a low pressure in a range of 1·10−8 Torr to 3·10−8 Torr, at a temperature in the range of 400° C. to 600° C. for a time interval of 10 seconds to 70 minutes before the treated material composition from the pre-processing step further is grown in an epitaxial process with the at least one III-V group material. |
地址 |
Trondheim NO |