发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING APPARATUS, AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To improve the operation speed of a gate and lower a leakage current.SOLUTION: A manufacture method of a semiconductor device includes the steps of: carrying a substrate where a high dielectric constant film and a metal containing film are formed into a processing chamber 10; supplying a process gas to an area above the substrate 11 carried into the processing chamber 10; and supplying micro waves to the substrate 11. The high dielectric constant film is formed on the substrate 11 through a silicon oxide film and the metal containing film is formed on the high dielectric constant film.
申请公布号 JP2014187269(A) 申请公布日期 2014.10.02
申请号 JP20130062009 申请日期 2013.03.25
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 OKUNO MASAHISA
分类号 H01L21/316;H01L21/268;H01L21/31;H01L21/336;H01L29/78 主分类号 H01L21/316
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