发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING APPARATUS, AND PROGRAM |
摘要 |
PROBLEM TO BE SOLVED: To improve the operation speed of a gate and lower a leakage current.SOLUTION: A manufacture method of a semiconductor device includes the steps of: carrying a substrate where a high dielectric constant film and a metal containing film are formed into a processing chamber 10; supplying a process gas to an area above the substrate 11 carried into the processing chamber 10; and supplying micro waves to the substrate 11. The high dielectric constant film is formed on the substrate 11 through a silicon oxide film and the metal containing film is formed on the high dielectric constant film. |
申请公布号 |
JP2014187269(A) |
申请公布日期 |
2014.10.02 |
申请号 |
JP20130062009 |
申请日期 |
2013.03.25 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
OKUNO MASAHISA |
分类号 |
H01L21/316;H01L21/268;H01L21/31;H01L21/336;H01L29/78 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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