METHOD FOR TESTING CHARGE GENERATION LAYER AND PROCESS FOR MANUFACTURING ELECTROPHOTOGRAPHIC PHOTORECEPTORS ON LARGE SCALE

摘要

A method is provided for testing a charge generation layer disposed directly on an undercoat layer disposed directly on an aluminum-based cylindrical support member formed by extrusion and drawing having a periphery not subjected to cutting work. The method includes testing the charge generation layer for a defect or a suspected defect by irradiating the charge generation layer with light, and receiving reflected light from the charge generation layer with a light receiving device. The light emitted to the charge generation layer has a wavelength within the range of the absorption wavelengths of the charge generation layer, and whose transmittance to the undercoat layer is 0.3% or less.

主权项

1. A method for inspecting a charge generation layer of an object including an aluminum-based cylindrical support member formed by extrusion and drawing having a periphery free of cutting work, an undercoat layer disposed directly on the periphery of the support member and having a transmittance of 1% or more for light having a wavelength in the visible region, and the charge generation layer disposed directly on the undercoat layer and having absorption wavelengths, the method comprising:
testing the charge generation layer for a defect or a suspected defect by:
irradiating the charge generation layer with light, andreceiving reflected light from the charge generation layer with a light receiving device, wherein the light has a wavelength within the range of the absorption wavelengths of the charge generation layer, and transmittance to the undercoat layer of the light is 0.3% or less.