发明名称 METHOD FOR DETECTING HEAT GENERATION POINTS AND DEVICE FOR DETECTING HEAT GENERATE POINTS
摘要 A heat generation point detection method comprises: step of stabilizing an average temperature of a surface of an integrated circuit S; steps of applying a bias voltage of a low frequency to the integrated circuit S and acquiring a heat generation detection signal detected from the integrated circuit S in response thereto; steps of supplying a bias voltage of a high frequency and acquiring a heat generation detection signal detected in response thereto; steps of detecting a phase shift between the bias voltage of the low frequency and the heat generation detection signal and a phase shift between the bias voltage of the high frequency and the heat generation detection signal; and step of calculating a change rate of the phase shift against a square root of the frequency of the bias voltage, and obtaining depth information of the heat generation point from the change rate.
申请公布号 US2014294038(A1) 申请公布日期 2014.10.02
申请号 US201214355596 申请日期 2012.08.31
申请人 Nakamura Tomonori 发明人 Nakamura Tomonori
分类号 G01K13/00;G01K17/00 主分类号 G01K13/00
代理机构 代理人
主权项 1. A method for detecting a depth of a heat generation point in an integrated circuit, comprising steps of: stabilizing an average temperature of a surface of the integrated circuit; supplying a first electric signal at a first frequency the integrated circuit; detecting a first detection signal indicative of a change of an amount of heat generation detected from the integrated circuit in response the first electric signal; supplying a second electric signal at a second frequency different from the first frequency to the integrated circuit; detecting a second detection signal indicative of a change of an amount of heat generation detected from the integrated circuit in response the second electric signal; and obtaining depth information of the heat generation point, based on the first and second detection signals.
地址 Hamamatsu-shi JP