发明名称 |
COMPOUND, ACTINIC-RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND PATTERN FORMATION METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE USING SAME, AND ELECTRONIC DEVICE |
摘要 |
Provided are a compound, actinic-ray-sensitive or radiation-sensitive resin composition, resist film, and pattern formation method, a method for manufacturing an electronic device using the same, and an electronic device, whereby high resolution and exposure latitude, and good pattern shape are realized in a minute (e.g., a line width or space width of 50 nm or less) region of pattern formation by an actinic-ray-sensitive or radiation-sensitive resin composition containing a compound represented by general formula (1) or (2). In the general formulas, R1-R5 each independently represent an organic group. At least two of R1-R3 may bond with each other and form a ring. At least one of R1-R3 and at least one of R4 and R5 each has at least one type of group selected from the group consisting of groups represented by general formulas (I)-(IV) described in the specification. Z- represents a non-nucleophilic anion. |
申请公布号 |
WO2014156524(A1) |
申请公布日期 |
2014.10.02 |
申请号 |
WO2014JP55678 |
申请日期 |
2014.03.05 |
申请人 |
FUJIFILM CORPORATION |
发明人 |
YOKOKAWA NATSUMI;TAKIZAWA HIROO;HIRANO SHUJI;NIHASHI WATARU;TSUBAKI HIDEAKI |
分类号 |
G03F7/004;C07C381/12;C08F12/30;C08F20/38;C08K5/36;C08L101/00;G03F7/038;G03F7/039;G03F7/32 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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