| 摘要 |
<p>An X-ray inspection apparatus and an X-ray inspection program capable of performing a highly accurate calibration to accurately inspect a target object regardless of the condition of a transport conveyor are provided. An X-ray inspection apparatus (10) is a device that detects, by an X-ray line sensor (14), X-rays used to irradiate a product (G) placed on a conveyor (12) and transmitted therethrough in order to detect the presence of foreign matter contained in the product (G). When performing a calibration of a plurality of pixels (14a) in the X-ray line sensor (14), an appropriate position of the conveyor (12) for the calibration is searched by various control blocks such as a determination unit (20a), a calibrating unit (20b), and the like formed in a control computer (20) installed in the X-ray inspection apparatus (10), and the calibration is performed based on the result detected by the X-ray line sensor (14) at the position.</p> |
