| 摘要 |
In order to be able to prevent analysis accuracy from being reduced by a backward flow of sample gas from dead volume in a cleaning mechanism into a cell at the time of analysis, a gas analysis device 100 is provided with: the cell 21 into which the sample gas is introduced; an analysis part 22, 23 that analyzes the sample gas introduced into the cell 21; gas ports 91 that are arranged toward predetermined regions of gas contact surfaces in the cell; and a piping mechanism 92 that connects the gas ports 91 to a predetermined purge gas source 93, and is configured to blow purge gas from the gas ports toward the predetermined regions at the time of purging that cleans the gas contact surfaces, and wherein the gas analysis device 100 is further provided with a switching part 94 that switches a connecting destination of the piping mechanism 92 from the purge gas source to a predetermined suction part 24, and configured to, at the time of introducing or analyzing the sample gas, connect the gas ports 92 to the suction source 24. |
