发明名称 MEASUREMENT APPARATUS AND METHOD
摘要 A measurement system (5) comprises a radiation source (10) and a detection system (15), wherein the radiation source is arranged such that radiation from the radiation source is incident on a sample (25) and the detection system is configured to receive at least part of the radiation via the sample, wherein the system is reconfigurable so as to vary a path length that the radiation travels through the sample and/or a reflectance of at least one surface upon which the radiation is incident after passing through at least part of the sample. A property of the sample may be determined based on at least the first and second measurements.
申请公布号 EP2783199(A1) 申请公布日期 2014.10.01
申请号 EP20120798800 申请日期 2012.11.21
申请人 UNIVERSITY OF STRATHCLYDE 发明人 THENNADIL, SURESH N.;CHEN, YI-CHIEH
分类号 G01N21/03;G01N21/47 主分类号 G01N21/03
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