发明名称 INSTRUMENTATION CIRCUIT FOR SHUNT-BASED METROLOGY MEASUREMENT
摘要 <p>Current flow at a line frequency may be measured from a source using matched voltage drops in a pair of voltage drop circuits. The voltage drop circuits may each includes a fixed value component, such as a resistor, and an adjustable value component, such as an adjustable current source, coupled in series. The adjustable valued components may be controlled based on differences in voltage drops produced by the voltage drop circuits based on a high-frequency signal, higher in frequency than the line frequency, applied to a control input for each of the adjustable value components.</p>
申请公布号 EP2783223(A1) 申请公布日期 2014.10.01
申请号 EP20110874208 申请日期 2011.12.01
申请人 ITRON, INC. 发明人 VAN WYK, HARTMAN;HADDAB, YOUCEF;DORMAND, JEAN-JACQUES
分类号 G01R1/20;G01R19/00 主分类号 G01R1/20
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