| 摘要 |
The present invention relates to an inspection device for a backlight unit and an inspection method thereof. The inspection device for the backlight unit is characterized by including a check-out stand, a first vertical scan camera, a first inclination scan camera, and a central processing unit. The purpose of the inspection device is to inspect faulties of the backlight unit including a dispersion sheet and a first prism sheet having a regular pattern and laminated on the upper side of the dispersion sheet. |
