| 摘要 |
<p>Provided is a scanning instrument that can obtain information about position and inclination of a central axis of an implant fixture used for an implant bridge with a high accuracy. A scanning instrument (10, 110) to be attached to an analog (20) that is embedded in a model, the scanning instrument comprising a main body (11, 111) having a cylindrical shape, a fixation member (12) to attach the main body to the analog, and a reference point (13) to obtain information about position and inclination of a central axis of the analog by using a pattern projection method.</p> |
