发明名称 Non-parallel grating arrangement with on-the-fly phase stepping, X-ray system
摘要 The present invention relates to X-rayimage acquisition technology in general. Employing phase-contrast imaging for X-rayimage acquisition may significantly enhance the visibility of structures in images acquired. However, phase-contrast information may only be obtainable in a small detector region with subsequent image acquisitions requiring individual phase stepping states to allow reconstruction of an X-ray image. Accordingly, a grating arrangement for phase-contrast imaging is provided which may allow on the fly phase stepping during a field of view scan. According to the present invention a grating arrangement (1) for phase-contrast imaging is provided, comprising a first grating element (8) and a second grating element (10). Each of the first grating element (8) and the second grating element (10) comprises a trench structure. The trench structure comprises at least one trench region (9) and at least one barrier region (3). The at least one trench region (9) and the at least one barrier region (3) are at least locally arranged in parallel. The first grating element (8) and the second grating element (10) are arranged such that the trench structure of the first grating element (8) and the trench structure of the second grating element (10) are non-parallel comprising an angle α.
申请公布号 US8848863(B2) 申请公布日期 2014.09.30
申请号 US201013514061 申请日期 2010.12.03
申请人 Koninklijke Philips N.V. 发明人 Schusser Sebastian;Vogtmeier Gereon
分类号 A61B6/00;G21K1/06 主分类号 A61B6/00
代理机构 代理人
主权项 1. A grating arrangement for phase contrast imaging, comprising: a first grating element; a second grating element; and an X-ray detector element; wherein each of the first grating element and the second grating element comprises a trench structure; wherein the trench structure comprises at least one trench region and at least one barrier region; wherein the at least one trench region and at least one barrier region are at least locally arranged in parallel; and wherein the first grating element and the second grating element are arranged such that the trench structure of the first grating element and the trench structure of the second grating element are, at least locally, non-parallel, said arrangement being configured for displacing, in a scanning movement, the first and second grating elements, and said X-ray detector element, as a single unit.
地址 Eindhoven NL