Semiconductor device and testing method thereof

摘要

A semiconductor device includes a plurality of cell blocks activated in response to a plurality of selection signals, respectively, a pre-selection signal generator configured to generate a plurality of pre-selection signals corresponding to the cell blocks, respectively, and activate at least two of the pre-selection signals by decoding addresses in a multi-test mode, a selection signal controller configured to selectively activate the plurality of selection signals in response to the plurality pre-selection signals and control active periods of the activated selection signals so as not to overlap, and a decision circuit configured to decide whether or not the cell blocks activated in response to the activated selection signals are repaired in response to stored repair information and the plurality of selection signals.

主权项

1. A semiconductor device comprising:
a plurality of cell blocks activated in response to a plurality of selection signals, respectively; a pre-selection signal generator configured to generate a plurality of pre-selection signals corresponding to the cell blocks, respectively, and simultaneously activate at least two of the pre-selection signals by decoding addresses in a multi-test mode; a selection signal controller configured to selectively activate the plurality of selection signals by controlling active periods of the simultaneously activated pre-selection signals so as not to overlap in response to a sequence control signal and a driving control signal; and a decision circuit configured to decide whether or not the activated cell blocks are repaired in response to stored repair information and the activated selection signals.