发明名称 Bump with protection structure
摘要 A semiconductor device includes a bump structure formed on a post-passivation interconnect (PPI) line and surrounded by a protection structure. The protection structure includes a polymer layer and at least one dielectric layer. The dielectric layer may be formed on the top surface of the polymer layer, underlying the polymer layer, inserted between the bump structure and the polymer layer, inserted between the PPI line and the polymer layer, covering the exterior sidewalls of the polymer layer, or combinations thereof.
申请公布号 US8847388(B2) 申请公布日期 2014.09.30
申请号 US201113267200 申请日期 2011.10.06
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Yu Chen-Hua;Chang Hung-Pin;Su An-Jhih;Wu Tsang-Jiuh;Chiou Wen-Chih;Jeng Shin-Puu
分类号 H01L23/48;H01L23/31;H01L23/00;H01L23/29 主分类号 H01L23/48
代理机构 Lowe Hauptman & Ham, LLP 代理人 Lowe Hauptman & Ham, LLP
主权项 1. A semiconductor device, comprising: a semiconductor substrate; a passivation layer over the semiconductor substrate; a post-passivation interconnect (PPI) line overlying the passivation layer; a protection structure overlying the passivation layer and the PPI line, wherein the protection structure has an opening at least exposing a portion of the PPI line; and a bump structure formed in the protection structure and electrically connected to the PPI line through the opening of the protection structure; wherein the protection structure comprises a polymer layer having opposite top and bottom surfaces, and opposite sidewall surfaces connecting the top surface and the bottom surface, anda dielectric layer surrounding the polymer layer, the dielectric layer covering the top surface, the bottom surface and the opposite sidewall surfaces of the polymer layer.
地址 TW