发明名称 |
METHOD AND SYSTEM FOR ANALYSIS FOR NONMETALLIC ELEMENT |
摘要 |
Provided are an analytical method and an analytical system with which impurities, such as nonmetallic elements, contained in a sample, e.g., an organic semiconductor material, can be easily detected precisely with high sensitivity. The method comprises: the step of bringing an organic semiconductor material into contact with supercritical water or subcritical water; and the step of detecting any nonmetallic element contained in the supercritical water or subcritical water which has been contacted with the organic semiconductor material. By the method, an organic semiconductor material which is solid is analyzed for nonmetallic elements. |
申请公布号 |
KR20140115331(A) |
申请公布日期 |
2014.09.30 |
申请号 |
KR20147020920 |
申请日期 |
2012.12.26 |
申请人 |
SUMIKA CHEMICAL ANALYSIS SERVICE, LTD. |
发明人 |
IMANISHI KATSUYA;OHASHI KAZUTOSHI;TSUKAGOSHI AKIHIKO |
分类号 |
G01N1/28;G01N21/17;G01N27/26;G01N30/02;G01N30/72;G01N31/00 |
主分类号 |
G01N1/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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