| 发明名称 | Semiconductor device and test method thereof | ||
| 摘要 | A semiconductor chip includes a memory array including a plurality of memory cells, a plurality of terminals including a plurality of test terminals to output a result of a specific test, and a circuit that outputs the result to a selected one of the plurality of test terminals based on a chip identification data. | ||
| 申请公布号 | US8848473(B2) | 申请公布日期 | 2014.09.30 |
| 申请号 | US201314088242 | 申请日期 | 2013.11.22 |
| 申请人 | PS4 Luxco S.A.R.L. | 发明人 | Nishioka Naohisa |
| 分类号 | G11C29/00;G11C29/26;G11C16/20;G11C29/08;G11C29/44;G11C7/10;G11C11/4093 | 主分类号 | G11C29/00 |
| 代理机构 | McGinn IP Law Group, PLLC | 代理人 | McGinn IP Law Group, PLLC |
| 主权项 | 1. A semiconductor chip comprising: a memory array including a plurality of memory cells; a plurality of terminals including a plurality of test terminals to output a result of a specific test; and a circuit that outputs the result to a selected one of the plurality of test terminals based on a chip identification data. | ||
| 地址 | Luxembourg LU | ||