发明名称 |
Metal cut process flow |
摘要 |
A method for optimizing masks used for forming conductive features and a method for creating the mask features on an IC device are disclosed. An exemplary embodiment includes receiving a design database including a plurality of conductive features. First and second features suitable for joining are identified from the plurality of conductive features. A joined feature corresponding to the first and the second features is characterized. A cut shape configured to separate the first and second features from the joined feature is also characterized. The joined feature is categorized into a first conductive mask, the cut shape is categorized into a cut mask, and a third feature is categorized into a second conductive mask. The categorized shapes and features of the first conductive mask, the second conductive mask, and the cut mask are provided for manufacturing a mask set corresponding to the categorized shapes and features. |
申请公布号 |
US8850369(B2) |
申请公布日期 |
2014.09.30 |
申请号 |
US201213451605 |
申请日期 |
2012.04.20 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Lung Yuan-Hsiang;Chen Kuei-Shun;Chen Meng-Wei;Lee Chia-Ying |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
Haynes and Boone, LLP |
代理人 |
Haynes and Boone, LLP |
主权项 |
1. A method of manufacturing an IC device comprising:
receiving an IC device precursor; forming a dielectric layer on the IC device precursor; forming a first and second hard mask layer on the dielectric layer, wherein the first hard mask layer is formed above the second hard mask layer; patterning the first hard mask layer using a first mask to form a first pattern on the first hard mask layer; patterning the second hard mask layer using the first pattern of the first hard mask layer and a second mask that is different from the first mask to form a second mask pattern that defines a first set of conductive features; patterning the first hard mask layer using a third mask that is different from both the first mask and the second mask to form a third pattern on the first hard mask layer; transferring the third mask pattern to the second hard mask layer from the first hard mask layer to define a second set of conductive features; etching the dielectric layer using the second hard mask layer having the second mask pattern and the third mask pattern formed thereupon; and depositing a conductive material to form the first and second sets of conductive features. |
地址 |
Hsin-Chu TW |