发明名称 Capacitive coupled sense amplifier biased at maximum gain point
摘要 A sense amplifier includes a first inverter including a first input node and a first output node, the first input node coupled to a first bitline through a first capacitor, the first output node coupled to a second bitline through a second capacitor, a second inverter including a second input node and a second output node, the second input node coupled to the second bitline through the second capacitor, the second output node to the first bitline through the first capacitor, a first transmission gate switch coupled between the first input node and the second input node, a second transmission gate switch coupled between a first common node of the first and second inverters and a second common node of the first and second inverters. The sense amplifier is maintained at a maximum gain point in a read cycle.
申请公布号 US8848474(B2) 申请公布日期 2014.09.30
申请号 US201313746653 申请日期 2013.01.22
申请人 LSI Corporation 发明人 Singh Sahilpreet
分类号 G11C7/00;G11C7/06 主分类号 G11C7/00
代理机构 代理人
主权项 1. A sense amplifier coupled between a complementary pair of first and second bitlines that are coupled to respective first and second global bitlines in a static random access memory (SRAM) cell, the sense amplifier comprising: a first inverter including a first input node and a first output node, the first input node coupled to the first bitline through a first capacitor, the first output node coupled to the second bitline through a second capacitor; a second inverter including a second input node and a second output node, the second input node coupled to the second bitline through the second capacitor, the second output node to the first bitline through the first capacitor; a first transmission gate switch coupled between the first input node and the second input node; and a second transmission gate switch coupled between a first common node of the first and second inverters and a second common node of the first and second inverters, wherein the sense amplifier is maintained at a maximum gain point in a read cycle of the SRAM cell.
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