Micro-granular delay testing of configurable ICs

摘要

A method for testing a set of circuitry in an integrated circuit (IC) is described. The IC includes multiple configurable circuits for configurably performing multiple operations. The method configures the IC to operate in a user mode with a set of test paths that satisfies a set of evaluation criteria. Each test path includes a controllable storage element for controllably storing a signal that the storage element receives. The method operates the IC in user mode. The method reads the values stored in the storage elements to determine whether the set of circuitry is operating within specified performance limits.

主权项

1. An integrated circuit (IC) comprising:
a plurality of configurable circuits, each configurable circuit for configurably performing operations according to a configuration data set; a launch element for providing a set of test stimulus; a capture element for capturing a set of responses to the set of test stimulus by a circuitry under test, wherein the circuitry under test comprises a set of the plurality of configurable circuits configured to perform a set of operations in a user mode; and a debug network for retrieving the captured set of responses.