发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING DEVICE, AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To form a thin film having high resistance and a low dielectric constant to HF in a low temperature region.SOLUTION: A method for manufacturing a semiconductor device includes a step of forming thin film having a borazine ring skeleton and containing a prescribed element, boron, carbon, and nitrogen on a substrate by performing a cycle including a step of supplying a first material gas containing a prescribed element and a halogen group to the substrate, a step of supplying a second material gas containing the prescribed element and an amino group to the substrate, a step of supplying a reaction gas containing an organic borazine compound to the substrate, and a step of supplying a carbon-containing gas to the substrate a prescribed number of times under the condition that the borazine ring skeleton in the organic borazine compound is held.
申请公布号 JP2014183223(A) 申请公布日期 2014.09.29
申请号 JP20130057192 申请日期 2013.03.19
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 HIROSE YOSHIRO;YAMAMOTO TAKAHARU;SANO ATSUSHI
分类号 H01L21/314;C23C16/42;H01L21/31;H01L21/336;H01L29/78 主分类号 H01L21/314
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