发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING DEVICE, AND PROGRAM |
摘要 |
PROBLEM TO BE SOLVED: To form a thin film having high resistance and a low dielectric constant to HF in a low temperature region.SOLUTION: A method for manufacturing a semiconductor device includes a step of forming thin film having a borazine ring skeleton and containing a prescribed element, boron, carbon, and nitrogen on a substrate by performing a cycle including a step of supplying a first material gas containing a prescribed element and a halogen group to the substrate, a step of supplying a second material gas containing the prescribed element and an amino group to the substrate, a step of supplying a reaction gas containing an organic borazine compound to the substrate, and a step of supplying a carbon-containing gas to the substrate a prescribed number of times under the condition that the borazine ring skeleton in the organic borazine compound is held. |
申请公布号 |
JP2014183223(A) |
申请公布日期 |
2014.09.29 |
申请号 |
JP20130057192 |
申请日期 |
2013.03.19 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
HIROSE YOSHIRO;YAMAMOTO TAKAHARU;SANO ATSUSHI |
分类号 |
H01L21/314;C23C16/42;H01L21/31;H01L21/336;H01L29/78 |
主分类号 |
H01L21/314 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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