| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide an X-ray analyzing system having improved resolution power and signal-to-noise ratio.SOLUTION: An X-ray analyzing system for X-ray scattering analysis comprises: an X-ray source for generating an X-ray beam along a transmission axis 3; a hybrid slit 5b with an aperture which defines the shape of the cross section of the beam; a sample to which surface the beam shaped by the hybrid slit 5b is directed; and an X-ray detector for detecting x-rays originating from the sample. The hybrid slit 5b comprises at least three hybrid slit elements, each hybrid slit element comprising a single crystal substrate 8 bonded to a base 9 at a taper angleα≠0, and the single crystal substrates 8 of the hybrid slit elements limits the aperture. The hybrid slit elements are staggered so as to be offset along a transmission axis 3.</p> |
