发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To attain desired flatness while suppressing scratches and cracks in a planarization process.SOLUTION: A method of manufacturing a semiconductor device comprises: a step of forming a film 13 to be processed, which includes asperities on a surface, via layers 14, 15 having a dielectric constant smaller than that of the SiOon a semiconductor substrate 10; a step of planarizing the surface of the film to be processed; and a step of etching the surface of the planarized film to be processed.</p>
申请公布号 JP2014183221(A) 申请公布日期 2014.09.29
申请号 JP20130057178 申请日期 2013.03.19
申请人 TOSHIBA CORP 发明人 MATSUI YUKITERU;KAWASE AKIFUMI;MINAMI FUKUGAKU
分类号 H01L21/304;H01L21/3065 主分类号 H01L21/304
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