发明名称 |
CLEANING METHOD AND CLEANING DEVICE OF GROUP III NITRIDE SEMICONDUCTOR MANUFACTURING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a cleaning method and a cleaning device of a group III nitride semiconductor manufacturing apparatus which ensures a long life of a filter.SOLUTION: A cleaning method of a group III nitride semiconductor manufacturing apparatus comprises: a process of supplying at least a chlorine-based cleaning gas to inside a cleaning room; a process of converting at least a part of the group III nitride semiconductor to GaClto remove the part of the group III nitride semiconductor coating from a component which is a cleaning object inside the cleaning room and discharging an exhaust gas containing GaClfrom the cleaning room; and a process of capturing GaClfrom the exhaust gas containing GaClby a first filter and a second filter lying downstream of the first filter in a gas flow. A filter having an aperture within a range of not less than 300 μm and not more than 500 μm is used as the first filter. A filter having an aperture within a range of not less than 2 μm and not more than 100 μm is used as the second filter. |
申请公布号 |
JP2014183245(A) |
申请公布日期 |
2014.09.29 |
申请号 |
JP20130057582 |
申请日期 |
2013.03.21 |
申请人 |
TOYODA GOSEI CO LTD |
发明人 |
SENDAI TOSHIAKI;WADA TETSUYA |
分类号 |
H01L21/205;C23C16/44;C30B25/14;C30B29/38;H01L21/3065 |
主分类号 |
H01L21/205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|