发明名称 PLASMA PROCESSING APPARATUS AND HEATER TEMPERATURE CONTROL METHOD
摘要 <p>A plasma processing apparatus is provided that converts a gas into plasma using a high frequency power and performs a plasma process on a workpiece using an action of the plasma. The plasma processing apparatus includes a processing chamber that can be depressurized, a mounting table that is arranged within the processing chamber and holds the workpiece, an electrostatic chuck that is arranged on the mounting table and electrostatically attracts the workpiece by applying a voltage to a chuck electrode, a heater arranged within or near the electrostatic chuck, and a temperature control unit. The heater is divided into a circular center zone, at least two middle zones arranged concentrically at an outer periphery side of the center zone, and an edge zone arranged concentrically at an outermost periphery. The temperature control unit adjusts a control temperature of the heater with respect to each of the zones.</p>
申请公布号 KR20140114817(A) 申请公布日期 2014.09.29
申请号 KR20147017920 申请日期 2013.01.09
申请人 TOKYO ELECTRON LIMITED 发明人 OOHASHI KAORU
分类号 H01L21/3065;H01L21/31;H01L21/324;H01L21/683 主分类号 H01L21/3065
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