发明名称 METHOD OF PRODUCTION OF DIELECTRIC LAYER OF MIS STRUCTURES HAVING EFFECT OF CONDUCTIVITY SWITCHING
摘要 FIELD: nanotechnology.SUBSTANCE: invention relates to the field of micro-and nanoelectronics. The method of manufacturing a dielectric layer of MIS structures having the effect of switching is application of the nanocomposite film of silicon oxynitride with the incorporated silicon clusters. Application is carried out by the method of plasma sputtering of the silicon target at a deposition rate of 5-7 nm/min in argon medium with additives of 3-5 vol% oxygen and 6-8 vol% nitrogen.EFFECT: obtaining dielectric layers having the effect of conductivity switching, fully compatible with the materials, as well as with most technological influences used in traditional silicon technology of integrated circuits.2 cl, 3 dwg
申请公布号 RU2529442(C2) 申请公布日期 2014.09.27
申请号 RU20120129255 申请日期 2012.07.10
申请人 FEDERAL'NOE GOSUDARSTVENNOE BJUDZHETNOE UCHREZHDENIE NAUKI FIZIKO-TEKHNOLOGICHESKIJ INSTITUT ROSSIJSKOJ AKADEMII NAUK 发明人 BERDNIKOV ARKADIJ EVGEN'EVICH;GERASHCHENKO VIKTOR NIKOLAEVICH;GUSEV VALERIJ NIKOLAEVICH;MIRONENKO ALEKSANDR ALEKSANDROVICH;ORLIKOVSKIJ ALEKSANDR ALEKSANDROVICH;POPOV ALEKSANDR AFANAS'EVICH;RUDYJ ALEKSANDR STEPANOVICH
分类号 H01L21/762 主分类号 H01L21/762
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