发明名称 SOCKET FOR TESTING ELECTRONICS
摘要 Provided is a socket for testing electronic components. The given socket for testing electronic components includes a base which has a mounting unit on which an FPCB with a terminal unit is mounted; a cover unit which is combined to the end of the base by a hinge shaft to be rotatable and includes a measurement pin at a position corresponding to the mounting unit of the base; and a pressurization unit which is combined between the base and the cover unit by a hinge shaft to be hinge-rotatable and applies pressure to place the FPCB closely to the mounting unit when the measurement pin and the terminal unit are being in contact with each other. The pressurization unit includes a pressurization plate which has a connection hole to provide a space for connecting the terminal unit and the measurement pin inside and includes an attachment piece to pressurize and fix the FPCB to the mounting unit on the outside of the connection hole; and a hook unit which is prepared on the lateral surface of the pressurization plate and includes a projection unit latched and connected to the cover unit to make the pressurization plate to hinge-rotate in link with the cover unit. By doing so, during the testing of electronic components, the terminal unit and the measurement pin can be in stable contact with each other.
申请公布号 KR101444774(B1) 申请公布日期 2014.09.26
申请号 KR20140028559 申请日期 2014.03.11
申请人 TCS CO., LTD. 发明人 JUNG, YOUNG JIN;KIM, SI JAE
分类号 G01R31/28 主分类号 G01R31/28
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