发明名称 Multi-Gate FETs and Methods for Forming the Same
摘要 A method includes oxidizing a semiconductor fin to form an oxide layer on opposite sidewalls of the semiconductor fin. The semiconductor fin is over a top surface of an isolation region. After the oxidizing, a tilt implantation is performed to implant an impurity into the semiconductor fin. The oxide layer is removed after the tilt implantation.
申请公布号 KR101445450(B1) 申请公布日期 2014.09.26
申请号 KR20120099929 申请日期 2012.09.10
申请人 发明人
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
代理机构 代理人
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