SPECTRUM TEST APPARATUS AND METHOD

摘要

Disclosed are a spectrum test apparatus and method. The spectrum test apparatus comprises: an integrating sphere (501), being hollow and disposed with a light outlet at the top, an inner wall being coated with a diffuse reflection layer, and diffusion at points of the diffuse reflection layer being even, to diffuse the light evenly; a light source (502), located at the center of the integrating sphere (501), and emitting light when energized; a baffle (503), located between the light outlet and light source (502), to prevent the light emitted by the light source (502) from be sent out from the light outlet without being diffused; and a test lens (504), located above the light outlet and used for testing light from the light outlet to obtain a spectrum, so as to solve a problem that in a conventional backlight source spectrum test method, because the light source cannot be tested directly, spectrum obtaining takes long time.