发明名称 ION IMPLANTATION UNDER HIGH TEMPERATURE SURFACE EQUILIBRIUM STATE
摘要 PROBLEM TO BE SOLVED: To provide various embodiments of ion implantation method and system under high temperature surface equilibrium state.SOLUTION: An ion implantation method under high temperature surface equilibrium state includes: a step 320 for placing a group III nitride semiconductor body in a surface equilibrium chamber; a step 330 for setting a gas pressure greater than or approximately equal to the surface equilibrium pressure of the group III nitride semiconductor body; and a step 340 for heating the group III nitride semiconductor body in the surface equilibrium chamber to a high implantation temperature, while maintaining the gas pressure substantially. Furthermore, a step 350 for performing ion implantation of the group III nitride semiconductor body at a high implantation temperature in the surface equilibrium chamber, while maintaining the gas pressure substantially, is included. Implantation is performed using an ion implanter interfacing with the surface equilibrium chamber.
申请公布号 JP2014179589(A) 申请公布日期 2014.09.25
申请号 JP20140020469 申请日期 2014.02.05
申请人 INTERNATL RECTIFIER CORP 发明人 BRIERE MICHAEL A
分类号 H01L21/265;H01J37/18;H01J37/317;H01L21/20 主分类号 H01L21/265
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