发明名称 SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING APPARATUS
摘要 According to one embodiment, a semiconductor device comprises a first electrode; a second electrode containing a metal element; and a variable resistance element formed between the first electrode and the second electrode. The variable resistance element comprises an insulating first film disposed on a side of the first electrode and containing oxygen; and a second film disposed on the side of the second electrode and containing an element having a diffusion coefficient larger than the diffusion coefficient of the metal element in the first film and an electronegativity higher than the electronegativity of the metal element.
申请公布号 US2014284540(A1) 申请公布日期 2014.09.25
申请号 US201314018906 申请日期 2013.09.05
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SUGURO Kyoichi
分类号 H01L45/00 主分类号 H01L45/00
代理机构 代理人
主权项 1. A semiconductor device comprising: a first electrode; a second electrode containing a metal element; and a variable resistance element formed between the first electrode and the second electrode, wherein the variable resistance element comprises: an insulating first film disposed on a side of the first electrode and containing oxygen; and a second film disposed on the side of the second electrode and containing an element having a diffusion coefficient larger than the diffusion coefficient of the metal element in the first film and an electronegativity higher than the electronegativity of the metal element.
地址 Tokyo JP