发明名称 |
NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE |
摘要 |
In a non-volatile semiconductor memory device, it is only necessary that, at the time of data writing, a voltage drop is caused in a high resistance region. Therefore, the value of voltage applied to a gate electrode can be reduced as compared with a conventional device. In correspondence with the reduction in the value of applied voltage, it is possible to reduce the film thickness of a gate insulating film of memory transistors, and further the film thickness of the gate insulating film of a peripheral transistor for controlling the memory transistors. As a result, the circuit configuration of the non-volatile semiconductor memory device can be reduced in size as compared with the conventional device. |
申请公布号 |
US2014284677(A1) |
申请公布日期 |
2014.09.25 |
申请号 |
US201414215536 |
申请日期 |
2014.03.17 |
申请人 |
FLOADIA CORPORATION |
发明人 |
Taniguchi Yasuhiro;Okuyama Kosuke |
分类号 |
H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A non-volatile semiconductor memory device including one or more memory transistors each having a single layer gate structure in which a gate electrode is provided on a substrate via a gate insulating film, wherein
the memory transistor comprises: a source region and a drain region each formed in a surface of the substrate; and a carrier storage region provided on the substrate and arranged between the gate electrode and the drain region, and in the surface of the substrate, a high resistance region is formed in a region in contact with the drain region and facing the carrier storage region, the high resistance region having a resistance value higher than a resistance value of the region between the source region and a channel region under the gate electrode. |
地址 |
Tokyo JP |