发明名称 |
MEASUREMENT METHOD AND POSITION ADJUSTMENT METHOD
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摘要 |
PROBLEM TO BE SOLVED: To relatively simply and quickly measure the defocus amounts of the measurement position of a surface to be inspected.SOLUTION: A measurement method for measuring defocus amounts as deviation amounts in an optical axial direction from the focal position of an imaging optical system 104 at the measurement position of a surface to be inspected includes: acquiring an evaluation value on the basis of the image of a mask 103 formed by the imaging optical system; and acquiring the defocus amounts corresponding to the evaluation value by using preliminarily acquired relation between the defocus amounts and evaluation value. The mask includes: first regions 35 and 36 having a first phase; and second regions 37 and 38 having a second phase different from the first phase. The evaluation value is acquired on the basis of a first value indicative of the imaging state of an image corresponding to the first regions and a second value indicative of the imaging state of the image corresponding to the second regions. |
申请公布号 |
JP2014178389(A) |
申请公布日期 |
2014.09.25 |
申请号 |
JP20130051093 |
申请日期 |
2013.03.13 |
申请人 |
CANON INC |
发明人 |
HIGAKI KINSEI ; YAMAZOE KENJI ; EGUCHI AKIRA |
分类号 |
G02B7/28;G02B21/00;H04N5/225;H04N5/232 |
主分类号 |
G02B7/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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