发明名称 SEMICONDUCTOR DEVICE HAVING A THROUGH-SUBSTRATE VIA
摘要 Semiconductor devices are described that include a via that extends only partially through the substrate. Through-substrate vias (TSV) furnish electrical interconnectivity to electronic components formed in the substrates. In implementations, the semiconductor devices are fabricated by first bonding a semiconductor wafer to a carrier wafer with an adhesive material. The semiconductor wafer includes an etch stop disposed within the wafer (e.g., between a first surface a second surface of the wafer). One or more vias are formed through the wafer. The vias extend from the second surface to the etch stop.
申请公布号 US2014284793(A1) 申请公布日期 2014.09.25
申请号 US201414299076 申请日期 2014.06.09
申请人 Maxim Integrated Products, Inc. 发明人 Samoilov Arkadii V.;Parent Tyler;Wang Larry Y.
分类号 H01L23/00;H01L23/498 主分类号 H01L23/00
代理机构 代理人
主权项 1. A process comprising: bonding a carrier wafer to a first surface of a semiconductor wafer with an adhesive material, the semiconductor wafer comprising an etch stop disposed within the semiconductor wafer between the first surface and a second surface opposite the first surface; and forming a via in the semiconductor wafer, the via extending from the second surface to the etch stop, the carrier wafer providing mechanical support to the semiconductor wafer during formation of the via.
地址 San Jose CA US