发明名称 Noncontact Measuring Device
摘要 A solution including a noncontact electronic measurement device is provided. The measurement device includes one or more imaging devices configured to acquire image data of a surface of an object located in a measurement region relative to the measurement device and one or more projected pattern generators configured to generate divergent pattern(s) of structured light, which impact the surface of the object within a field of view of the imaging device when the object is located in the measurement region. Using image data acquired by the imaging device(s), a computer system can measure a set of attributes of the surface of the object and/or automatically determine whether the measurement device is within the measurement region. An embodiment is configured to be held by a human user during operation.
申请公布号 US2014285658(A1) 申请公布日期 2014.09.25
申请号 US201414219173 申请日期 2014.03.19
申请人 INTERNATIONAL ELECTRONIC MACHINES CORPORATION 发明人 Mian Zahid F.;Spoor Ryk E.;Gamache Ronald W.
分类号 G01B5/08;H04N7/18;G01B5/00 主分类号 G01B5/08
代理机构 代理人
主权项 1. A system comprising: a handheld measurement device including: a first imaging device configured to acquire image data of a surface of an object located in a measurement region relative to the handheld measurement device;a projected pattern generator configured to generate a divergent pattern of structured light, wherein the divergent pattern of structured light impacts the surface of the object within a field of view of the first imaging device when the object is located in the measurement region; anda computer system configured to measure a set of attributes of the surface of the object by performing a measurement method including: activating the first imaging device;processing the image data acquired by the first imaging device in response to the activating; anddetermining a measurement of at least one attribute of the surface of the object based on the processing.
地址 Troy NY US