发明名称 TEMPERATURE MEASURING APPARATUS AND TEMPERATURE MEASURING METHOD
摘要 A temperature measuring apparatus includes a light source, a first splitter, a second splitter, a reference beam reflector, an optical path length adjuster, a reference beam transmitting member, a first to an nth measuring beam transmitting member and a photodetector. The temperature measuring apparatus further includes an attenuator that attenuates the reference beam reflected from the reference beam reflector to thereby make an intensity thereof closer to an intensity of the measurement beam reflected from the temperature measurement object.
申请公布号 US2014286375(A1) 申请公布日期 2014.09.25
申请号 US201414296647 申请日期 2014.06.05
申请人 TOKYO ELECTRON LIMITED 发明人 ABE Jun;MATSUDO Tatsuo;KOSHIMIZU Chishio
分类号 G01J5/02 主分类号 G01J5/02
代理机构 代理人
主权项 1. A temperature measuring apparatus comprising: a light source; a single splitter for dividing a light beam emanated from the light source into a reference beam and a first to an nth measuring beam, n being larger than 1; a reference beam reflector for reflecting the reference beam coming from the splitter; an optical path length adjuster for adjusting an optical path length of the reference beam reflected from the reference beam reflector; a reference beam transmitting member for transmitting the reference beam coming from the splitter to a reference beam irradiation position from which the reference beam is irradiated onto the reference beam reflector; a first to an nth measuring beam transmitting member for transmitting the first to the nth measuring beam coming from the splitter to measuring beam irradiating positions from which the measurement beams are irradiated onto a first to an nth measurement points of a temperature measurement object; and a photodetector for measuring an interference between the reference beam reflected from the reference beam reflector and the first to the nth measuring beam reflected from the temperature measurement object, wherein the optical path lengths of the first to the nth measuring beam from the splitter to the temperature measurement object are different from each other.
地址 Tokyo JP