| 摘要 |
PROBLEM TO BE SOLVED: To achieve a plate wave inspection device executing a long distance inspection even in a plate to be inspected having an R part and a step part and capable of improving a detection sensitivity.SOLUTION: A probe 3 is moved up above the upper part of a test part 1 for calibration having the same shape and quality of material as an object 10 to be inspected, and a rotating stage 5 is adjusted. The probe 3 scans a reflection source of the test part 1 for calibration, calculates a relationship between a propagation time and a defect position and the relationship between the propagation time and a detection sensitivity, and corrects data obtained by inspecting the object 10 to be inspected using the calculated relationships. Thereby, even the object 10 to be inspected having the R part and the step part can be subjected to a long distance inspection, and a water immersion plate wave inspection device for executing a plate wave inspection capable of improving detection sensitivity can be achieved. |
