发明名称 MICROWAVE HEAT TREATMENT METHOD
摘要 The present disclosure relates to a heat treatment method of performing a single crystallization of amorphous silicon formed on a substrate to be processed by irradiating the substrate with a microwave. The heat treatment method includes: irradiating the substrate with a microwave to increase a temperature of the substrate to a first temperature such that the amorphous silicon formed on the substrate becomes a single crystal at an interface between the substrate and the amorphous silicon and a nucleation does not occur in a region except the interface; irradiating the substrate with a microwave to heat the substrate at the first temperature for a predetermined period; irradiating the substrate with the microwave to increase the first temperature to a second temperature, which is higher than the first temperature; and irradiating the substrate with the microwave to heat the substrate at the second temperature.
申请公布号 US2014283734(A1) 申请公布日期 2014.09.25
申请号 US201414223547 申请日期 2014.03.24
申请人 TOKYO ELECTRON LIMITED 发明人 MONDEN Taichi;KITAGAWA Junichi;HONG Seokhyoung;KABE Yoshiro
分类号 C30B1/02;C30B30/00 主分类号 C30B1/02
代理机构 代理人
主权项 1. A heat treatment method of performing a single crystallization of an amorphous silicon formed on a substrate to be processed by irradiating the substrate with a microwave, the method comprising: irradiating the substrate with a microwave to increase a temperature of the substrate to a first temperature such that the amorphous silicon formed on the substrate becomes a single crystal at an interface between the substrate and the amorphous silicon and a nucleation does not occur in a region except the interface; irradiating the substrate with a microwave to heat the substrate at the first temperature for a predetermined period; irradiating the substrate with the microwave to increase the first temperature to a second temperature, which is higher than the first temperature; and irradiating the substrate with the microwave to heat the substrate at the second temperature.
地址 Tokyo JP