发明名称 SEMICONDUCTOR DEVICE AND SIGMA-DELTA LOOP MEMS ACQUISITION
摘要 A semiconductor device measures a state of a MEMS as a first voltage variation at a sensing node. The state of the MEMS includes a capacitance. A first capacitor is coupled between the sensing node and an input of an integrator for transferring the first voltage variation to a second node as a first signal. A second voltage variation is routed through a second capacitor to the second node as a second signal. The integrator integrates the first signal and second signal to provide an integrated signal. An ADC has an input coupled to an output of the integrator and converts the integrated signal to a digital signal representative of the capacitance of the MEMS. A DAC has an input coupled to the output of the ADC. A second capacitor is coupled between an output of the DAC and the sensing node.
申请公布号 WO2014150613(A1) 申请公布日期 2014.09.25
申请号 WO2014US23786 申请日期 2014.03.11
申请人 SEMTECH CORPORATION;CHEVROULET, MICHEL;NYS, OLIVIER 发明人 CHEVROULET, MICHEL;NYS, OLIVIER
分类号 H03M3/00;H03M1/12;H03M3/02 主分类号 H03M3/00
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