CIRCUIT AND METHOD OF ON-DIE TERMINATION, SEMICONDUCTOR DEVICE INCLUDING THE SAME

摘要

Disclosed are an on-die termination circuit which changes an offset code of a ZQ calibration circuit in response to a ZQ calibration result value, and a semiconductor device including the same. The on-die termination (ODT) circuit includes: a calibration unit, an offset-code generating unit, an adder, and an ODT unit. The calibration unit generates a pull-up code and a pull-down code. The offset code generates a pull-up offset code and a pull-down offset code based on a mode-register-set signal, the pull-up code, and the pull-down code. The adder adds the pull-up offset code and the pull-down offset code to the pull-up code and the pull-down code, respectively, and generates a pull-up calibration code and a pull-down calibration code. The ODT unit changes ODT resistance in response to the pull-up calibration code and the pull-down calibration code.