| 摘要 |
PROBLEM TO BE SOLVED: To provide an image inspection device which inspects gloss distribution of a measurement object by irradiating the measurement object with illumination light from an oblique direction using a gloss illumination device including a plurality of aligned light-emitting elements such as reflection LEDs and emitting parallel light in a wide range, and by receiving regular reflection light with an image pickup element, and in which an inspection accuracy is improved while illumination unevenness is allowed to be generated.SOLUTION: The gloss illumination device is moved in an alignment direction (main scan direction) of the light-emitting elements to thereby image gloss distribution of the measurement object for a plurality of times. Pixel values are averaged to be synthesized for a plurality of two-dimensional gloss distribution images, and the synthesized two-dimensional gloss distribution image is inspected. |
