发明名称 PREDICTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a prediction apparatus capable of predicting a degree of advance of a deterioration range of a substrate.SOLUTION: A plurality of conductor patterns are formed on a substrate 17. Each conductor pattern has an input terminal and an output terminal. An inspection signal is inputted to the input terminal of any one of the plurality of conductor patterns. Output terminals of the plurality of conductor patterns respectively output signals. A degree of advance of the deterioration range of the substrate can be predicted on the basis of respective signals received from the output terminals of the plurality of conductor patterns.
申请公布号 JP2014178177(A) 申请公布日期 2014.09.25
申请号 JP20130051713 申请日期 2013.03.14
申请人 FUJITSU TELECOM NETWORKS LTD 发明人 ISHII TAKESHI
分类号 G01N17/00 主分类号 G01N17/00
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