发明名称 DETECTION STRUCTURE
摘要 <p>Provided is a detection structure which has high strength, and for which the manufacturing process is not liable to be complex and costs can be reduced. A detection structure that is used in a method that detects an object to be measured by detecting changes in resonance characteristics due to the presence or absence of the object to be measured when exposed to electromagnetic waves, wherein a detection structure (1) comprises a base (1A) having a first main face (1a) and a second main face (1b), and a periodic structure body (1B) provided on the first main face (1a) of the base (1A). The periodic structure body (1B) has unit structures (13) disposed periodically, and the unit structure (13) have thickness-direction faces (3-6) that extend in the thickness direction or in a direction that intersects the thickness direction at an angle.</p>
申请公布号 WO2014148140(A1) 申请公布日期 2014.09.25
申请号 WO2014JP52870 申请日期 2014.02.07
申请人 MURATA MANUFACTURING CO., LTD. 发明人 KAMBA, SEIJI;KONDO, TAKASHI
分类号 G01N21/01;G01N21/3581 主分类号 G01N21/01
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