发明名称 PREDICTION METHOD FOR RESIDUAL CREEP LIFE IN PRODUCTS DEGRADED BY HEAT AND PRESSURE AND METHOD FOR CREATING STANDARD CURVE USED IN PREDICTION METHOD
摘要 <p>[Problem] To provide a prediction method for residual creep life in products degraded by heat and pressure. Namely, to provide a prediction method for residual creep life that is characterized by including a step of setting an evaluation region on the surface of a product, a step of finding, in the evaluation region, the length and number of grain boundaries in which voids exist, a step of finding the number of voids existing on each grain boundary and the length of same in the direction of the grain boundary in the evaluation region, a step of finding an M parameter, on the basis of the equation below, from the acquired number and length of the grain boundaries in which voids exist and the acquired number of voids existing on each of the grain boundaries and the length of same in the direction of the grain boundary, and a step of finding a product damage rate from the acquired M parameter, and characterized in that the product has a bainite structure. (In the equation: m expresses the number of grain boundaries in which voids exists; n expresses the number of voids that exist on each boundary; lαi expresses the length of the ith void existing on theαth grain boundary in the direction of the grain boundary; and Lαexpresses the length of theαth grain boundary in which a void exists.)</p>
申请公布号 WO2014147829(A1) 申请公布日期 2014.09.25
申请号 WO2013JP58369 申请日期 2013.03.22
申请人 THE CHUGOKU ELECTRIC POWER CO., INC. 发明人 NISHIDA, HIDETAKA
分类号 G01N17/00;G01N3/32 主分类号 G01N17/00
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