发明名称 |
METHODS FOR PRODUCING INTERCONNECTS IN SEMICONDUCTOR DEVICES |
摘要 |
A method for producing interconnects on a workpiece includes the following steps: preparing a substrate having a feature as a workpiece; depositing a conductive layer in the feature to fill the feature in part or in whole; depositing a copper fill to completely fill the feature if the feature is partially filled with the conductive layer; applying a copper overburden; thermally treating the workpiece; and removing the overburden to expose the substrate and the metalized feature. |
申请公布号 |
KR20140113611(A) |
申请公布日期 |
2014.09.24 |
申请号 |
KR20140031320 |
申请日期 |
2014.03.17 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
EMESH ISMAIL T.;SHAVIV ROEY;NAIK MEHUL |
分类号 |
H01L21/203;H01L21/304;H01L21/324 |
主分类号 |
H01L21/203 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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