发明名称 ION IMPLANTATION
摘要 Here, at least one technique or system for ion implantation is provided. A pressure control module maintains a practically constant pressure in an ion implantation or process chamber. The pressure is maintained based on properties such as a space charge effect related to an implantation layer, pressure data, feedback, photoresist (PR) outgassing, PR coating rate, and an implantation layer. Effects related to the PR outgassing are reduced by maintaining the pressure inside the process chamber, thereby reducing the neutralization of ions. More excellent control with regard to the implantation of ions is achieved by maintaining charged ions, thereby implanting ions up to a desired depth.
申请公布号 KR20140113285(A) 申请公布日期 2014.09.24
申请号 KR20130137312 申请日期 2013.11.13
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHENG NAI HAN;YANG CHI MING
分类号 H01L21/265 主分类号 H01L21/265
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