发明名称 METHOD FOR SELF-DIAGNOSING OF VOLATILE MEMORY DEVICE AND ELECTRONIC DEVICE
摘要 <p>According to a self-diagnosing method of a volatile memory device, a processor outputs a self-refresh entrance command and enters a power save mode, and a volatile memory device performs a self-diagnosing operation for a plurality of memory cells in response to the self-refresh entrance command while the processor is in the power save mode. According to the self-diagnosing method of a volatile memory device, self-diagnosis can be performed efficiently without degrading the performance of an electronic device.</p>
申请公布号 KR20140113069(A) 申请公布日期 2014.09.24
申请号 KR20130027985 申请日期 2013.03.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KONG, JAE SOP
分类号 G11C29/08 主分类号 G11C29/08
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