发明名称
摘要 PROBLEM TO BE SOLVED: To predict a life of an LED in a short period of time by sequentially measuring the luminance, voltage, and current of the LED in a highly adverse environment. SOLUTION: An LED 700 to be tested is arranged in a HAST device 500. After the HAST device 500 has reached its test conditions, the LED 700 to be tested is supplied with a constant current from the outside to receive the amount of light of the LED by a photo-electric element 910. The current is drawn to the outside of the HAST device to measure the luminance of the LED 700 to be tested. Measurement data of the current and voltage of the LED 700 itself are drawn to the outside of the HAST device 500 to predict the tendency of the deterioration of the LED 700 to be tested. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP5596372(B2) 申请公布日期 2014.09.24
申请号 JP20100043757 申请日期 2010.03.01
申请人 发明人
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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