发明名称 |
DETERMINING A MALFUNCTIONING DEVICE IN A PLASMA SYSTEM |
摘要 |
Disclosed are systems and methods for determining a malfunctioning device in a plasma system. One of the methods includes a step of receiving an indication whether plasma is generated within a plasma chamber of the plasma system. The plasma system includes a processing portion and a power delivery portion. The method includes the steps of: determining whether the plasma system operates within constraints when the indication that the plasma is generated is received; determining a value of a variable at an output of the power delivery portion when the processing portion is decoupled from the power delivery portion; and comparing the determined value with a pre-recorded value of the variable. The method includes the steps of: determining whether the determined value is outside a range of the pre-recorded value; and determining that the malfunctioning device is within the power delivery portion upon determining that the determined value is outside the range of the pre-recorded value. |
申请公布号 |
KR20140113593(A) |
申请公布日期 |
2014.09.24 |
申请号 |
KR20140031108 |
申请日期 |
2014.03.17 |
申请人 |
LAM RESEARCH CORPORATION |
发明人 |
VALCORE JR. JOHN C.;LYNDAKER BRADFORD J.;SATO ARTHUR |
分类号 |
H01L21/00 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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