发明名称 Semiconductor device having seal wiring
摘要 A semiconductor device includes: an interlayer insulating film formed on a substrate; a wiring formed in the interlayer insulating film in a chip region of the substrate; a seal ring formed in the interlayer insulating film in a periphery of the chip region and continuously surrounding the chip region; and a first protective film formed on the interlayer insulating film having the wiring and the seal ring formed therein. A first opening is formed in the first protective film in a region located outside the seal ring when viewed from the chip region, and the interlayer insulating film is exposed in the first opening.
申请公布号 US8841753(B2) 申请公布日期 2014.09.23
申请号 US201213428992 申请日期 2012.03.23
申请人 Panasonic Corporation 发明人 Takemura Koji;Hirano Hiroshige;Itoh Yutaka;Sano Hikari;Koike Koji
分类号 H01L23/544 主分类号 H01L23/544
代理机构 McDermott Will & Emery LLP 代理人 McDermott Will & Emery LLP
主权项 1. A semiconductor device comprising: an interlayer insulating film formed on a substrate; a first seal wiring formed in the interlayer insulating film in a periphery of a chip region; a first protective film formed on the interlayer insulating film having the first seal wiring formed therein; a cap layer formed on the first protective film over the first seal wiring; a second protective film formed on the first protective film; a groove formed in a part of the interlayer insulating film located outside the first seal wiring when viewed from the chip region; a first opening formed in the first protective film such that the groove is directly below the first opening; a second opening formed in the first protective film having a part of the cap layer provided therein to be in contact with the first seal wiring; a third opening formed in the second protective film, wherein: the groove and the cap layer are provided in the third opening.
地址 Osaka JP
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