发明名称 Semiconductor device and method of forming the same
摘要 In one embodiment, a semiconductor device includes a semiconductor substrate having a first groove; and a plurality of first pillars over the substrate. The plurality of first pillars is disposed beside the first groove. A first insulator is disposed in the first groove. A bit contact is disposed in the first groove and over the first insulator. The bit contact is coupled to side surfaces of the plurality of first pillars.
申请公布号 US8841717(B2) 申请公布日期 2014.09.23
申请号 US201213398275 申请日期 2012.02.16
申请人 PS4 Luxco S.A.R.L. 发明人 Mikasa Noriaki
分类号 H01L27/108 主分类号 H01L27/108
代理机构 Young & Thompson 代理人 Young & Thompson
主权项 1. A semiconductor device comprising: a first single-crystal semiconductor pillar projected from a substrate, the first single-crystal semiconductor pillar including a first top surface and a first side surface extending downwardly from the first top surface; and a bit contact including a topmost surface, a bottommost surface and a second side surface interfacing the topmost and bottommost surfaces with each other, a part of the second side surface of the bit contact being in direct contact with a part of the first side surface of the first single-crystal semiconductor pillar so that the first top surface of the first single-crystal semiconductor pillar is placed between the topmost and bottommost surfaces of the bit contact, a second single-crystal semiconductor pillar projected from the substrate apart from the first single-crystal semiconductor pillar to form a gap between the first and second single-crystal semiconductor pillars, the second single-crystal semiconductor pillar including a second top surface and a third side surface extending downwardly from the second top surface; a word line filling a part of the gap in isolation from each of the first and second single-crystal semiconductor pillars with a gate insulating film; a first diffusion region formed in an upper portion of the first single-crystal semiconductor pillar; and a second diffusion region formed in an upper portion of the second single-crystal semiconductor pillar, wherein the first diffusion region is formed more deeply than the second diffusion region.
地址 Luxembourg LU